ISSN: 2310-757X
Please use this identifier to cite or link to this item:
https://elar.urfu.ru/handle/10995/80793| Title: | Domain patterning by focused electron beam in wide temperature range in lithium niobate crystal with surface dielectric layer |
| Authors: | Chezganov, D. S. Vlasov, E. O. Gimadeeva, L. V. Esin, A. A. Chuvakova, M. A. Mikhailovskii, V. Yu. Zelenovskiy, P. S. Shur, V. Ya. Шур, В. Я. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Domain patterning by focused electron beam in wide temperature range in lithium niobate crystal with surface dielectric layer / D. S. Chezganov, E. O. Vlasov, L. V. Gimadeeva, A. A. Esin, M. A. Chuvakova, V. Yu. Mikhailovskii, P. S. Zelenovskiy, V. Ya. Shur // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 78. |
| URI: | http://elar.urfu.ru/handle/10995/80793 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Sponsorship: | The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University was used. The research was made possible by the Russian Science Foundation (grant № 17-72-10152). |
| RSCF project card: | 17-72-10152 |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_056.pdf | 161,01 kB | Adobe PDF | View/Open |
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