1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80737
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dc.contributor.authorTurygin, A. P.en
dc.contributor.authorAbramov, A. S.en
dc.contributor.authorAlikin, D. O.en
dc.contributor.authorChezganov, D. S.en
dc.contributor.authorBaturin, I. S.en
dc.contributor.authorSong, X.en
dc.contributor.authorZhang, T.en
dc.contributor.authorZhang, Y.en
dc.contributor.authorHu, K.en
dc.contributor.authorZhao, Z.en
dc.contributor.authorShur, V. Ya.en
dc.contributor.authorШур, В. Я.ru
dc.date.accessioned2020-03-24T06:59:30Z-
dc.date.available2020-03-24T06:59:30Z-
dc.date.issued2018-
dc.identifier.citationLocal electromechanical properties of barium strontium titanate based glass-ceramics / A. P. Turygin, A. S. Abramov, D. O. Alikin, D. S. Chezganov, I. S. Baturin, X. Song, T. Zhang, Y. Zhang, K. Hu, Z. Zhao, V. Ya. Shur // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 219.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80737-
dc.description.sponsorshipThe equipment of the Ural Center for Shared Use “Modern Nanotechnology” Ural Federal University was used. The research was made possible by Russian Foundation for Basic Research (Grant 18-52-53032).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleLocal electromechanical properties of barium strontium titanate based glass-ceramicsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage219-
local.description.lastpage219-
local.description.orderP-97-
Appears in Collections:Scanning Probe Microscopy

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