1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80714
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dc.contributor.authorRaevskaya, S. I.en
dc.contributor.authorLutokhin, A. G.en
dc.contributor.authorZakharov, Y. N.en
dc.contributor.authorRaevski, I. P.en
dc.contributor.authorGusev, A. A.en
dc.contributor.authorIsupov, V. P.en
dc.contributor.authorTitov, V. V.en
dc.contributor.authorMalitskaya, M. A.en
dc.contributor.authorLi, G. R.en
dc.date.accessioned2020-03-24T06:59:25Z-
dc.date.available2020-03-24T06:59:25Z-
dc.date.issued2018-
dc.identifier.citationThe effect of the bias electric field on the dielectric and pyroelectric properties of single crystals and ceramics of Pb2ScNbO6 relaxor ferroelectric / S. I. Raevskaya, A. G. Lutokhin, Y. N. Zakharov, I. P. Raevski, A. A. Gusev, V. P. Isupov, V. V. Titov, M. A. Malitskaya, G. R. Li // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 187.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80714-
dc.description.sponsorshipThis study was supported by RFBR (project 17-03-01293_a), by the Ministry of Education and Science of the Russian Federation (project 3.1649.2017/4.6) and by the Chinese Academy of Sciences President’s International Fellowship Initiative (project 2018VEA0011).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleThe effect of the bias electric field on the dielectric and pyroelectric properties of single crystals and ceramics of Pb2ScNbO6 relaxor ferroelectricen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage187-
local.description.lastpage187-
local.description.orderP-76-
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