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http://elar.urfu.ru/handle/10995/80701Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Mushinsky, S. S. | en |
| dc.contributor.author | Petukhov, I. V. | en |
| dc.contributor.author | Permyakova, M. A. | en |
| dc.contributor.author | Kichigin, V. I. | en |
| dc.contributor.author | Malinina, L. N. | en |
| dc.contributor.author | Volyntsev, A. B. | en |
| dc.date.accessioned | 2020-03-24T06:59:22Z | - |
| dc.date.available | 2020-03-24T06:59:22Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.citation | Structural phase transitions during annealing of proton-exchanged layers on X-cut and Z-cut lithium niobate / S. S. Mushinsky, I. V. Petukhov, M. A. Permyakova, V. I. Kichigin, L. N. Malinina, A. B. Volyntsev // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 172. | en |
| dc.identifier.isbn | 978-5-9500624-1-4 | - |
| dc.identifier.uri | http://elar.urfu.ru/handle/10995/80701 | - |
| dc.description.sponsorship | This work was supported by Russian Foundation For Basic Research (project № 17-43-590309 р_а). | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.publisher | Ural Federal University | en |
| dc.relation.ispartof | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 | en |
| dc.title | Structural phase transitions during annealing of proton-exchanged layers on X-cut and Z-cut lithium niobate | en |
| dc.type | Conference Paper | en |
| dc.type | info:eu-repo/semantics/conferenceObject | en |
| dc.type | info:eu-repo/semantics/publishedVersion | en |
| dc.conference.name | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" | en |
| dc.conference.date | 26.08.2018-29.08.2018 | - |
| local.description.firstpage | 172 | - |
| local.description.lastpage | 172 | - |
| local.description.order | P-64 | - |
| Appears in Collections: | Scanning Probe Microscopy | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_123.pdf | 186,03 kB | Adobe PDF | View/Open |
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