1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80694
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dc.contributor.authorMelnikova, G. B.en
dc.contributor.authorKonstantinova, E. E.en
dc.contributor.authorTolstaya, T. N.en
dc.contributor.authorPetrovskaya, A. S.en
dc.contributor.authorChizhik, S. A.en
dc.contributor.authorShyshko, O. N.en
dc.date.accessioned2020-03-24T06:59:20Z-
dc.date.available2020-03-24T06:59:20Z-
dc.date.issued2018-
dc.identifier.citationThe influence silicon dioxide nanoparticles on mechanical properties of erythrocyte and platelet membranes estimated by atomic force microscopy method / G. B. Melnikova, E. E. Konstantinova, T. N. Tolstaya, A. S. Petrovskaya, S. A. Chizhik, O. N. Shyshko // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 164.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80694-
dc.description.sponsorshipThe investigation performed within the Programs of State Research “Energy systems, process and technologies”, project 2.2.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleThe influence silicon dioxide nanoparticles on mechanical properties of erythrocyte and platelet membranes estimated by atomic force microscopy methoden
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage164-
local.description.lastpage164-
local.description.orderP-58-
Appears in Collections:Scanning Probe Microscopy

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