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http://elar.urfu.ru/handle/10995/80693Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Maslyanaya, K. V. | en |
| dc.contributor.author | Chezganov, D. S. | en |
| dc.contributor.author | Vlasov, E. O. | en |
| dc.contributor.author | Kuznetsov, D. K. | en |
| dc.contributor.author | Greshnyakov, E. D. | en |
| dc.contributor.author | Shur, V. Ya. | en |
| dc.contributor.author | Шур, В. Я. | ru |
| dc.date.accessioned | 2020-03-24T06:59:19Z | - |
| dc.date.available | 2020-03-24T06:59:19Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.citation | Domain formation by ion beam in lithium niobate crystal with suppression of surface charging by electron and UV-flood guns / K. V. Maslyanaya, D. S. Chezganov, E. O. Vlasov, D. K. Kuznetsov, E. D. Greshnyakov, V. Ya. Shur // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 163. | en |
| dc.identifier.isbn | 978-5-9500624-1-4 | - |
| dc.identifier.uri | http://elar.urfu.ru/handle/10995/80693 | - |
| dc.description.sponsorship | The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University was used. The research was made possible by the Russian Science Foundation (grant № 17-72-10152). | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.publisher | Ural Federal University | en |
| dc.relation | info:eu-repo/grantAgreement/RSF//17-72-10152 | en |
| dc.relation.ispartof | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 | en |
| dc.title | Domain formation by ion beam in lithium niobate crystal with suppression of surface charging by electron and UV-flood guns | en |
| dc.type | Conference Paper | en |
| dc.type | info:eu-repo/semantics/conferenceObject | en |
| dc.type | info:eu-repo/semantics/publishedVersion | en |
| dc.conference.name | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" | en |
| dc.conference.date | 26.08.2018-29.08.2018 | - |
| local.description.firstpage | 163 | - |
| local.description.lastpage | 163 | - |
| local.description.order | P-57 | - |
| local.fund.rsf | 17-72-10152 | - |
| Appears in Collections: | Scanning Probe Microscopy | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_116.pdf | 161,23 kB | Adobe PDF | View/Open |
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