ISSN: 2310-757X
Please use this identifier to cite or link to this item:
https://elar.urfu.ru/handle/10995/79234| Title: | Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM |
| Authors: | Lebedev, D. V. Mukhin, I. S. Shkoldin, V. A. Mozharov, A. M. Golubok, A. O. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Study of inelastic electron tunneling in the Pt-Au tunnel junction in ultra-high vacuum STM / D. V. Lebedev, I. S. Mukhin, V. A. Shkoldin, A. M. Mozharov, A. O. Golubok // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 108-109. |
| URI: | http://elar.urfu.ru/handle/10995/79234 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| Sponsorship: | This work was carried out with the support of the Russian Science Foundation (Grant 17-19-01532). |
| RSCF project card: | 17-19-01532 |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_089.pdf | 349,09 kB | Adobe PDF | View/Open |
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