1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/79130
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dc.contributor.authorSharov, V. A.en
dc.contributor.authorShugurov, K. Yu.en
dc.contributor.authorFedorov, V. V.en
dc.contributor.authorMozharov, A. M.en
dc.date.accessioned2019-12-19T12:26:15Z-
dc.date.available2019-12-19T12:26:15Z-
dc.date.issued2019-
dc.identifier.citationSharov V. A. Conductive AFM study of the electronic properties of vertical GaN nanowires / V. A. Sharov, K. Yu. Shugurov, V. V. Fedorov, A. M. Mozharov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 260.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/79130-
dc.description.sponsorshipV.A.S. thanks for support of the heterostructures characterization and K.Yu.S. thanks for support of the experimental data analysis the Ministry of Science and Higher Education of the Russian Federation (Grants 16.2593.2017/4.6 and 3.9796.2017/8.9, correspondingly), V.V.F. and A.M.M. thanks for support of the growth processes the Russian Federation President Council for grants (MK-1204.2019.2 and SP-2324.2018.1, correspondingly).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleConductive AFM study of the electronic properties of vertical GaN nanowiresen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage260-
local.description.lastpage260-
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