ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10995/79130| Title: | Conductive AFM study of the electronic properties of vertical GaN nanowires |
| Authors: | Sharov, V. A. Shugurov, K. Yu. Fedorov, V. V. Mozharov, A. M. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Sharov V. A. Conductive AFM study of the electronic properties of vertical GaN nanowires / V. A. Sharov, K. Yu. Shugurov, V. V. Fedorov, A. M. Mozharov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 260. |
| URI: | http://hdl.handle.net/10995/79130 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| metadata.dc.description.sponsorship: | V.A.S. thanks for support of the heterostructures characterization and K.Yu.S. thanks for support of the experimental data analysis the Ministry of Science and Higher Education of the Russian Federation (Grants 16.2593.2017/4.6 and 3.9796.2017/8.9, correspondingly), V.V.F. and A.M.M. thanks for support of the growth processes the Russian Federation President Council for grants (MK-1204.2019.2 and SP-2324.2018.1, correspondingly). |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_210.pdf | 254,85 kB | Adobe PDF | View/Open |
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