Visualization of polarization and electrical charges using Atomic Force Microscopy

Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/79117

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DC Field	Value	Language
dc.contributor.author	Hong, S.	en
dc.date.accessioned	2019-12-19T12:26:13Z	-
dc.date.available	2019-12-19T12:26:13Z	-
dc.date.issued	2019	-
dc.identifier.citation	Hong S. Visualization of polarization and electrical charges using Atomic Force Microscopy / S. Hong // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 6.	en
dc.identifier.isbn	978-5-9500624-2-1	-
dc.identifier.uri	http://elar.urfu.ru/handle/10995/79117	-
dc.format.mimetype	application/pdf	en
dc.language.iso	en	en
dc.publisher	Ural Federal University	en
dc.relation.ispartof	Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019	en
dc.title	Visualization of polarization and electrical charges using Atomic Force Microscopy	en
dc.type	Conference Paper	en
dc.type	info:eu-repo/semantics/conferenceObject	en
dc.type	info:eu-repo/semantics/publishedVersion	en
dc.conference.name	3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"	en
dc.conference.date	25.08.2019-28.08.2019	-
local.description.firstpage	6	-
local.description.lastpage	6	-
Appears in Collections:	Scanning Probe Microscopy

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