Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/79041
Title: Electron beam processing of silicon carbide substrate to obtain graphene-like carbon films
Authors: Gusev, E. Yu.
Karmanov, M. P.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Gusev E. Yu. Electron beam processing of silicon carbide substrate to obtain graphene-like carbon films / E. Yu. Gusev, M. P. Karmanov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 163-164.
URI: http://elar.urfu.ru/handle/10995/79041
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
Sponsorship: This study was financially supported by Southern Federal University. The results were obtained using the equipment of the Research and Education Center "Nanotechnologies" of Southern Federal University.
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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