Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/74003
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dc.contributor.authorAlikin, D.en
dc.contributor.authorSlautin, B.en
dc.contributor.authorAbramov, A.en
dc.contributor.authorRosato, D.en
dc.contributor.authorShur, V.en
dc.contributor.authorTselev, A.en
dc.contributor.authorKholkin, A.en
dc.date.accessioned2019-06-26T07:41:55Z-
dc.date.available2019-06-26T07:41:55Z-
dc.date.issued2019-
dc.identifier.citationCorrelative confocal Raman and scanning probe microscopy in the ionically active particles of LiMn 2 O 4 cathodes / D. Alikin, B. Slautin, A. Abramov, et al. // Materials. — 2019. — Vol. 12. — Iss. 9. — 1416. — DOI: 10.3390/ma12091416.en
dc.identifier.issn1996-1944-
dc.identifier.otherhttps://www.mdpi.com/1996-1944/12/9/1416/pdfpdf
dc.identifier.other1good_DOI
dc.identifier.othera3b003fe-8948-47eb-b49d-d1d931411c7fpure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85065743719m
dc.identifier.urihttp://hdl.handle.net/10995/74003-
dc.description.abstractIn this contribution, a correlative confocal Raman and scanning probe microscopy approach was implemented to find a relation between the composition, lithiation state, and functional electrochemical response in individual micro-scale particles of a LiMn 2 O 4 spinel in a commercial Li battery cathode. Electrochemical strain microscopy (ESM) was implemented both at a low-frequency (3.5 kHz) and in a high-frequency range of excitation (above 400 kHz). It was shown that the high-frequency ESM has a significant cross-talk with topography due to a tip-sample electrostatic interaction, while the low-frequency ESM yields a response correlated with distributions of Li ions and electrochemically inactive phases revealed by the confocal Raman microscopy. Parasitic contributions into the electromechanical response from the local Joule heating and flexoelectric effect were considered as well and found to be negligible. It was concluded that the low-frequency ESM response directly corresponds to the confocal Raman microscopy data. The analysis implemented in this work is an important step towards the quantitative measurement of diffusion coefficients and ion concentration via strain-based scanning probe microscopy methods in a wide range of ionically active materials. © 2019 by the authors.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherMDPI AGen
dc.relationinfo:eu-repo/grantAgreement/RSF//17-72-10144en
dc.rightscc-byother
dc.sourceMaterialsen
dc.subjectBATTERIESen
dc.subjectCATHODESen
dc.subjectCONFOCAL RAMAN MICROSCOPYen
dc.subjectLIMN 2 O 4en
dc.subjectLITHIUM MANGANATEen
dc.subjectLOW-FREQUENCY ELECTROCHEMICAL STRAIN MICROSCOPYen
dc.subjectQUANTITATIVE ELECTROCHEMICAL STRAIN MICROSCOPYen
dc.subjectSCANNING PROBE MICROSCOPYen
dc.subjectCATHODESen
dc.subjectHYDROPHOBICITYen
dc.subjectLITHIUM BATTERIESen
dc.subjectLITHIUM COMPOUNDSen
dc.subjectLITHIUM-ION BATTERIESen
dc.subjectMANGANESE COMPOUNDSen
dc.subjectSOLAR CELLSen
dc.subjectTOPOGRAPHYen
dc.subjectCONFOCAL RAMAN MICROSCOPYen
dc.subjectELECTROCHEMICAL RESPONSEen
dc.subjectELECTROCHEMICAL STRAIN MICROSCOPIESen
dc.subjectELECTROMECHANICAL RESPONSEen
dc.subjectLIMN2O4en
dc.subjectLITHIUM MANGANATESen
dc.subjectMICRO-SCALE PARTICLESen
dc.subjectQUANTITATIVE MEASUREMENTen
dc.subjectSCANNING PROBE MICROSCOPYen
dc.titleCorrelative confocal Raman and scanning probe microscopy in the ionically active particles of LiMn 2 O 4 cathodesen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeArticleen
dc.identifier.doi10.3390/ma12091416-
dc.identifier.scopus85065743719-
local.affiliationSchool of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federationen
local.affiliationRobert Bosch GmbH, Gerlingen-Schillerhoehe, 70839, Germanyen
local.affiliationDepartment of Physics, CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro, 3810-193, Portugalen
local.contributor.employeeАликин Денис Олеговичru
local.contributor.employeeАликин Денис Олеговичru
local.contributor.employeeСлаутин Борис Николаевичru
local.contributor.employeeАбрамов Александр Сергеевичru
local.contributor.employeeШур Владимир Яковлевичru
local.contributor.employeeШур Владимир Яковлевичru
local.contributor.employeeХолкин Андрей Леонидовичru
local.issue9-
local.volume12-
dc.identifier.wos000469757500057-
local.contributor.departmentИнститут естественных наук и математикиru
local.identifier.pure9806848-
local.description.order1416-
local.identifier.eid2-s2.0-85065743719-
local.fund.rsf17-72-10144-
local.identifier.wosWOS:000469757500057-
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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