Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/130835
Title: Influence of Zirconium (Zr4+) Substitution on the Crystal Structure and Optical and Dielectric Properties of Sr0.8Mg0.2(Sn1-xZrx)O3 Ceramics
Authors: Anas, M.
Ali, A.
Khan, A. G.
Alhodaib, A.
Zaman, A.
Ahmad, T.
Tirth, V.
Algahtani, A.
Ahmad, S.
Abdullaeva, B. S.
Al-Mughanam, T.
Aslam, M.
Issue Date: 2023
Publisher: American Chemical Society
Citation: Anas, M, Ali, A, Khan, AG, Alhodaib, A, Zaman, A, Ahmad, T, Tirth, V, Algahtani, A, Ahmad, S, Abdullaeva, BS, Al-Mughanam, T & Aslam, M 2023, 'Influence of Zirconium (Zr4+) Substitution on the Crystal Structure and Optical and Dielectric Properties of Sr0.8Mg0.2(Sn1-x Zrx )O3 Ceramics', ACS Omega, Том. 8, № 37, стр. 33794-33801. https://doi.org/10.1021/acsomega.3c04224
Anas, M., Ali, A., Khan, A. G., Alhodaib, A., Zaman, A., Ahmad, T., Tirth, V., Algahtani, A., Ahmad, S., Abdullaeva, B. S., Al-Mughanam, T., & Aslam, M. (2023). Influence of Zirconium (Zr4+) Substitution on the Crystal Structure and Optical and Dielectric Properties of Sr0.8Mg0.2(Sn1-x Zrx )O3 Ceramics. ACS Omega, 8(37), 33794-33801. https://doi.org/10.1021/acsomega.3c04224
Abstract: In this work, new compositions of Sr0.8Mg0.2(Sn1-xZrx)O3 0.00 ≤ x ≤ 0.06 ceramics are designed and synthesized by the conventional solid-state route. The influence of Zr doping on the phase, microstructural, optical, and dielectric properties is thoroughly investigated. The peaks (0 0 4) and (1 1 0) are observed to shift toward lower 2θ values, due to the variation of the ionic radius between Zr4+ and Sn4+. X-ray diffraction patterns reveal the orthorhombic structure with the space group Pbnm. Scanning electron microscopy images reveal the presence of pores and particles with a high degree of agglomeration. The functional groups and modes of vibration are determined by Fourier transform infrared spectroscopy of the prepared metal oxide samples. The existence of green emission of all the synthesized samples around 554.91 nm is identified by photoluminescence spectroscopy. The dielectric properties of the fabricated samples are measured by using an impedance analyzer. The values of the tangent loss and relative permittivity are found to decrease with increasing frequency. © 2023 The Authors. Published by American Chemical Society.
Keywords: COPPER(I) COMPLEXES
HIGH FLUORESCENCE RATES
SILVER(I) COMPLEXES
SINGLET HARVESTING
THERMALLY ACTIVATED DELAYED FLUORESCENCE
URI: http://elar.urfu.ru/handle/10995/130835
Access: info:eu-repo/semantics/openAccess
cc-by-nc-nd
License text: https://creativecommons.org/licenses/by-nc-nd/4.0/
SCOPUS ID: 85173133926
WOS ID: 001064878300001
PURE ID: 46046586
ISSN: 2470-1343
DOI: 10.1021/acsomega.3c04224
metadata.dc.description.sponsorship: GRANT4110; Deanship of Scientific Research, King Saud University; Deanship of Scientific Research, King Khalid University: 61421, RGP.2/498/44
The authors extend their appreciation to the Deanship of Scientific Research at King Khalid University Abha 61421, Asir, Kingdom of Saudi Arabia, for funding this work through the Large Groups Project under grant number RGP.2/498/44. The authors acknowledge the Deanship of Scientific Research, Vice Presidency for Graduate Studies and Scientific Research at King Faisal University, Saudi Arabia, for financial support under the annual funding track [GRANT4110].
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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