Криостат на основе He-3 для исследования сверхпроводимости сверхтонких алюминиевых плёнок

Abstract

Even back in 1938 an increase of the superconducting critical temperature with a reduction of an Al film thickness was observed. This effect was investigated mainly on highly disordered films, but virtually unexplored for ultra-thin monocrystalline structures. In this communication we report about the experimental setup based on the 3He cryo-insert, which was designed for the measurement of transport properties of superconductive Al films at 0.02-0.3 K temperature range.