Point defects and anelasticity in pure and Gd-doped ceria

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/104077

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DC Field	Value	Language
dc.contributor.author	Kraynis, O.	en
dc.contributor.author	Wachtel, E.	en
dc.contributor.author	Frenkel, A.	en
dc.contributor.author	Lubomirsky, I.	en
dc.date.accessioned	2021-09-20T13:51:27Z	-
dc.date.available	2021-09-20T13:51:27Z	-
dc.date.issued	2017	-
dc.identifier.citation	Point defects and anelasticity in pure and Gd-doped ceria / O. Kraynis, E. Wachtel, A. Frenkel et al. // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 27-30, 2017). — Ekaterinburg, Ural Federal University, 2017. — 23-23 p.	en
dc.identifier.isbn	978-5-9500624-0-7	-
dc.identifier.uri	http://elar.urfu.ru/handle/10995/104077	-
dc.format.mimetype	application/pdf	en
dc.language.iso	en	en
dc.publisher	Ural Federal University	en
dc.relation.ispartof	International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research". — Ekaterinburg, 2017	ru
dc.title	Point defects and anelasticity in pure and Gd-doped ceria	en
dc.type	Conference Paper	en
dc.type	info:eu-repo/semantics/conferenceObject	en
dc.type	info:eu-repo/semantics/publishedVersion	en
dc.conference.name	International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research"	en
dc.conference.date	27.08.2017-30.08.2017	-
local.description.firstpage	23	-
local.description.lastpage	23	-
local.description.order	I-08	-
Appears in Collections:	Scanning Probe Microscopy

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