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http://elar.urfu.ru/handle/10995/102245
Title: | Imprint effect in PZT thin films at compositions around the morphotropic phase boundary |
Authors: | Araujo, E. B. Lima, E. C. Bdikin, I. K. Kholkin, A. L. |
Issue Date: | 2016 |
Publisher: | Taylor and Francis Inc. |
Citation: | Imprint effect in PZT thin films at compositions around the morphotropic phase boundary / E. B. Araujo, E. C. Lima, I. K. Bdikin, et al. — DOI 10.1080/00150193.2016.1166421 // Ferroelectrics. — 2016. — Vol. 498. — Iss. 1. — P. 18-26. |
Abstract: | Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d33 before poling with some reports in the literature, the existence of point defects such as complex vacancies (Vpb.., VO.. and Vpb..-VO..) and Ti3+ centers is discussed as probable origin for the imprint effect observed here. © 2016, © Taylor & Francis Group, LLC. |
Keywords: | IMPRINT PZT THIN FILMS POINT DEFECTS SCHOTTKY BARRIER DIODES COMPOSITION DEPENDENCE FILM SUBSTRATES FORCE MICROSCOPY IMPRINT IMPRINT EFFECT MECHANICAL COUPLING MORPHOTROPIC PHASE BOUNDARIES SCHOTTKY BARRIERS THIN FILMS |
URI: | http://elar.urfu.ru/handle/10995/102245 |
Access: | info:eu-repo/semantics/openAccess |
SCOPUS ID: | 84975143327 |
PURE ID: | 1025437 e8455e21-53ef-4bfa-b132-c2a06491fc84 |
ISSN: | 150193 |
DOI: | 10.1080/00150193.2016.1166421 |
Appears in Collections: | Научные публикации, проиндексированные в SCOPUS и WoS CC |
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