Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102245
Title: Imprint effect in PZT thin films at compositions around the morphotropic phase boundary
Authors: Araujo, E. B.
Lima, E. C.
Bdikin, I. K.
Kholkin, A. L.
Issue Date: 2016
Publisher: Taylor and Francis Inc.
Citation: Imprint effect in PZT thin films at compositions around the morphotropic phase boundary / E. B. Araujo, E. C. Lima, I. K. Bdikin, et al. — DOI 10.1080/00150193.2016.1166421 // Ferroelectrics. — 2016. — Vol. 498. — Iss. 1. — P. 18-26.
Abstract: Piezoeresponse force microscopy (PFM) and local piezoresponse hysteresis loops were used to study the imprint effect in PbZr1-xTixO3 thin films at compositions around the morphotropic phase boundary (MPB). Schottky barriers and mechanical coupling between film-substrate were excluded as origin for the imprint in these films. Comparing the composition dependence of the effective d33 before poling with some reports in the literature, the existence of point defects such as complex vacancies (Vpb.., VO.. and Vpb..-VO..) and Ti3+ centers is discussed as probable origin for the imprint effect observed here. © 2016, © Taylor & Francis Group, LLC.
Keywords: IMPRINT
PZT
THIN FILMS
POINT DEFECTS
SCHOTTKY BARRIER DIODES
COMPOSITION DEPENDENCE
FILM SUBSTRATES
FORCE MICROSCOPY
IMPRINT
IMPRINT EFFECT
MECHANICAL COUPLING
MORPHOTROPIC PHASE BOUNDARIES
SCHOTTKY BARRIERS
THIN FILMS
URI: http://hdl.handle.net/10995/102245
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 84975143327
PURE ID: 1025437
e8455e21-53ef-4bfa-b132-c2a06491fc84
ISSN: 150193
DOI: 10.1080/00150193.2016.1166421
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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