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http://elar.urfu.ru/handle/10995/101656
Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Sánchez, P. A. | en |
dc.contributor.author | Vögele, M. | en |
dc.contributor.author | Smiatek, J. | en |
dc.contributor.author | Qiao, B. | en |
dc.contributor.author | Sega, M. | en |
dc.contributor.author | Holm, C. | en |
dc.date.accessioned | 2021-08-31T14:58:41Z | - |
dc.date.available | 2021-08-31T14:58:41Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Atomistic simulation of PDADMAC/PSS oligoelectrolyte multilayers: Overall comparison of tri- And tetra-layer systems / P. A. Sánchez, M. Vögele, J. Smiatek, et al. — DOI 10.1039/c9sm02010a // Soft Matter. — 2019. — Vol. 15. — Iss. 46. — P. 9437-9451. | en |
dc.identifier.issn | 1744683X | - |
dc.identifier.other | Final | 2 |
dc.identifier.other | All Open Access, Green | 3 |
dc.identifier.other | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85075736932&doi=10.1039%2fc9sm02010a&partnerID=40&md5=620d956cf0986e1eca8d2dd5776fb2e8 | |
dc.identifier.other | http://arxiv.org/pdf/1910.14506 | m |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/101656 | - |
dc.description.abstract | By employing large-scale molecular dynamics simulations of atomistically resolved oligoelectrolytes in aqueous solutions, we study in detail the first four layer-by-layer deposition cycles of an oligoelectrolyte multilayer made of poly(diallyl dimethyl ammonium chloride)/poly(styrene sulfonate sodium salt) (PDADMAC/PSS). The multilayers are grown on a silica substrate in 0.1 M NaCl electrolyte solutions and the swollen structures are then subsequently exposed to varying added salt concentration. We investigated the microscopic properties of the films, analyzing in detail the differences between three- and four-layer systems. Our simulations provide insights into the early stages of growth of a multilayer, which are particularly challenging for experimental observations. We found rather strong complexation of the oligoelectrolytes, with fuzzy layering of the film structure. The main charge compensation mechanism is for all cases intrinsic, whereas extrinsic compensation is relatively enhanced for the layer of the last deposition cycle. In addition, we quantified other fundamental observables of these systems, such as the film thickness, water uptake, and overcharge fractions for each deposition layer. This journal is © The Royal Society of Chemistry. | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.publisher | Royal Society of Chemistry | en |
dc.rights | info:eu-repo/semantics/openAccess | en |
dc.source | Soft Matter | 2 |
dc.source | Soft Matter | en |
dc.subject | DEPOSITION | en |
dc.subject | ELECTROLYTES | en |
dc.subject | MOLECULAR DYNAMICS | en |
dc.subject | SILICA | en |
dc.subject | SODIUM CHLORIDE | en |
dc.subject | STYRENE | en |
dc.subject | ATOMISTIC SIMULATIONS | en |
dc.subject | DEPOSITION CYCLES | en |
dc.subject | DEPOSITION LAYERS | en |
dc.subject | ELECTROLYTE SOLUTIONS | en |
dc.subject | LARGE-SCALE MOLECULAR DYNAMICS | en |
dc.subject | LAYER BY LAYER DEPOSITION | en |
dc.subject | MICROSCOPIC PROPERTIES | en |
dc.subject | POLY(DIALLYL-DIMETHYL-AMMONIUM CHLORIDE) | en |
dc.subject | MULTILAYERS | en |
dc.title | Atomistic simulation of PDADMAC/PSS oligoelectrolyte multilayers: Overall comparison of tri- And tetra-layer systems | en |
dc.type | Article | en |
dc.type | info:eu-repo/semantics/article | en |
dc.type | info:eu-repo/semantics/publishedVersion | en |
dc.identifier.doi | 10.1039/c9sm02010a | - |
dc.identifier.scopus | 85075736932 | - |
local.contributor.employee | Sánchez, P.A., Ural Federal University, 51 Lenin av., Ekaterinburg, 620000, Russian Federation, Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf E.V., Dresden, Germany | |
local.contributor.employee | Vögele, M., Department of Computer Science, Stanford University, Stanford, CA, United States | |
local.contributor.employee | Smiatek, J., Institut für Computerphysik, Universität Stuttgart, Stuttgart, 70569, Germany | |
local.contributor.employee | Qiao, B., Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, IL, United States | |
local.contributor.employee | Sega, M., Forschungszentrum Jülich, Helmholtz Institute Erlangen-Nuremberg, Nuremberg, Germany | |
local.contributor.employee | Holm, C., Institut für Computerphysik, Universität Stuttgart, Stuttgart, 70569, Germany | |
local.description.firstpage | 9437 | - |
local.description.lastpage | 9451 | - |
local.issue | 46 | - |
local.volume | 15 | - |
dc.identifier.wos | 000502539900002 | - |
local.contributor.department | Ural Federal University, 51 Lenin av., Ekaterinburg, 620000, Russian Federation | |
local.contributor.department | Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf E.V., Dresden, Germany | |
local.contributor.department | Department of Computer Science, Stanford University, Stanford, CA, United States | |
local.contributor.department | Institut für Computerphysik, Universität Stuttgart, Stuttgart, 70569, Germany | |
local.contributor.department | Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, IL, United States | |
local.contributor.department | Forschungszentrum Jülich, Helmholtz Institute Erlangen-Nuremberg, Nuremberg, Germany | |
local.identifier.pure | 9bfe69ca-26a6-4e77-9e1f-c41e7982464b | uuid |
local.identifier.pure | 11331303 | - |
local.identifier.eid | 2-s2.0-85075736932 | - |
local.identifier.wos | WOS:000502539900002 | - |
local.identifier.pmid | 31720676 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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2-s2.0-85075736932.pdf | 3,57 MB | Adobe PDF | Просмотреть/Открыть |
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