Browsing by Subject SECONDARY ION MASS SPECTROMETRY
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
| 2022 | Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy | Alikin, D.; Abramov, A.; Turygin, A.; Ievlev, A.; Pryakhina, V.; Karpinsky, D.; Hu, Q.; Jin, L.; Shur, V.; Tselev, A.; Kholkin, A. |
| 2014 | Oxygen tracer diffusion and surface exchange kinetics in Ba0.5Sr0.5Co0.8Fe0.2O3 - δ | Berenov, A.; Atkinson, A.; Kilner, J.; Ananyev, M.; Eremin, V.; Porotnikova, N.; Farlenkov, A.; Kurumchin, E.; Bouwmeester, H. J. M.; Bucher, E.; Sitte, W. |
