Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79027
Title: Magnetic field effect on the TGS:Cr dielectric properties and real structure
Authors: Eremeev, A. P.
Gainutdinov, R. V.
Ivanova, E. S.
Petrzhik, E. A.
Lashkova, A. K.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Magnetic field effect on the TGS:Cr dielectric properties and real structure / A. P. Eremeev, R. V. Gainutdinov, E. S. Ivanova, E. A. Petrzhik, A. K. Lashkova // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 149.
URI: http://hdl.handle.net/10995/79027
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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