Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/73476
Title: Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry
Authors: Ushakov, A. D.
Yavo, N.
Mishuk, E.
Lubomirsky, I.
Shur, V. Ya.
Kholkin, A. L.
Issue Date: 2016
Publisher: Knowledge E
Citation: Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry / A. D. Ushakov, N. Yavo, E. Mishuk [et al.] // KNE Materials Science. — 2016. — Vol. 2016. — P. 177-182. — DOI: 10.18502/kms.v1i1.582.
URI: http://hdl.handle.net/10995/73476
WOS ID: WOS:000395106000030
ISSN: 2519-1438
DOI: 10.18502/kms.v1i1.582
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS

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