Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/51560
Title: Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence
Authors: Sokolov, V. I.
Pustovarov, V. A.
Churmanov, V. N.
Ivanov, V. Yu.
Gruzdev, N. B.
Sokolov, P. S.
Baranov, A. N.
Moskvin, A. S.
Пустоваров, В. А.
Issue Date: 2012
Citation: Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence / V. I. Sokolov, V. A. Pustovarov, V. N. Churmanov, V. Yu. Ivanov, N. B. Gruzdev, P. S. Sokolov, A. N. Baranov, A. S. Moskvin // JETP Letters. — 2012. — Vol. 95. — № 10. — P. 528-533.
Abstract: Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons. © 2012 Pleiades Publishing, Ltd.
URI: http://hdl.handle.net/10995/51560
metadata.dc.rights: info:eu-repo/semantics/restrictedAccess
RSCI ID: 20475097
SCOPUS ID: 84864390747
WOS ID: WOS:000306950800007
PURE ID: 1079637
ISSN: 0021-3640
DOI: 10.1134/S0021364012100116
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS

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