Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/50999
Title: Intrinsic UV-VUV luminescence and X-ray emission spectroscopy of BeO and multicomponent oxide dielectrics
Authors: Ivanov, V.
Pustovarov, V. A.
Kikas, A.
Käämbre, T.
Kuusik, I.
Kirm, M.
Пустоваров, В. А.
Issue Date: 2012
Citation: Intrinsic UV-VUV luminescence and X-ray emission spectroscopy of BeO and multicomponent oxide dielectrics / V. Ivanov, V. A. Pustovarov, A. Kikas, T. Käämbre, I. Kuusik, M. Kirm // Functional Materials. — 2012. — Vol. 19. — № 1. — P. 60-65.
Abstract: The experimental study of intrinsic UV-VUV luminescence and X-ray emission at the selective excitations near fundamental absorption edge as well as at the inner-shell excitations for binary BeO crystal and multicomponent oxide crystals Be 2Si0 4, Y 2Si0 5 and La 2Be 20 5 has been performed. The results show that relaxation during the time-scale of decay of short-living anion and cation excitations leads to creation of self-trapped excitons at the same low-symmetry local structural units of crystalline lattice. The applied experimental method gives an opportunity to clarify a participation of different crystalline units of complex oxides in the self-trapping of excitons. © 2012 - STC "Institute for Single Crystals".
URI: http://hdl.handle.net/10995/50999
SCOPUS: http://www.scopus.com/inward/record.url?scp=84859900853&partnerID=8YFLogxK
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS

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