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|Title:||Intrinsic UV-VUV luminescence and X-ray emission spectroscopy of BeO and multicomponent oxide dielectrics|
Pustovarov, V. A.
Пустоваров, В. А.
|Citation:||Intrinsic UV-VUV luminescence and X-ray emission spectroscopy of BeO and multicomponent oxide dielectrics / V. Ivanov, V. A. Pustovarov, A. Kikas, T. Käämbre, I. Kuusik, M. Kirm // Functional Materials. — 2012. — Vol. 19. — № 1. — P. 60-65.|
|Abstract:||The experimental study of intrinsic UV-VUV luminescence and X-ray emission at the selective excitations near fundamental absorption edge as well as at the inner-shell excitations for binary BeO crystal and multicomponent oxide crystals Be 2Si0 4, Y 2Si0 5 and La 2Be 20 5 has been performed. The results show that relaxation during the time-scale of decay of short-living anion and cation excitations leads to creation of self-trapped excitons at the same low-symmetry local structural units of crystalline lattice. The applied experimental method gives an opportunity to clarify a participation of different crystalline units of complex oxides in the self-trapping of excitons. © 2012 - STC "Institute for Single Crystals".|
|Appears in Collections:||Научные публикации, проиндексированные в SCOPUS и WoS|
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