Features of the magnetic properties of Co/Si/Co thin-film systems

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/27121

Title:	Features of the magnetic properties of Co/Si/Co thin-film systems
Authors:	Shalygina, E. E. Kharlamova, A. M. Rozhnovskaya, A. A. Kurlyandskaya, G. V. Svalov, A. V.
Issue Date:	2013
Citation:	Features of the magnetic properties of Co/Si/Co thin-film systems / E. E. Shalygina, A. M. Kharlamova, A. A. Rozhnovskaya [et al.] // Technical Physics Letters. — 2013. — Vol. 39. — № 12. — P. 1089-1092.
Abstract:	The magnetic properties of Co/Si/Co thin-film structures grown by magnetron sputtering have been studied using magnetooptical techniques. It is established that the saturation field (H S) of trilayers exhibits oscillations as a function of the thickness of the semiconductor (silicon) interlayer. This behavior is explained by structural features of the Co/Si/Co system and the presence of antiferromagnetic exchange coupling between magnetic layers via the silicon interlayer. © 2013 Pleiades Publishing, Ltd.
URI:	http://elar.urfu.ru/handle/10995/27121
RSCI ID:	21904230
SCOPUS ID:	84891283274
WOS ID:	000329111800018
PURE ID:	841816
ISSN:	1063-7850
DOI:	10.1134/S1063785013120249
Appears in Collections:	Научные публикации, проиндексированные в SCOPUS и WoS CC

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