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dc.contributor.authorZatsepin, D. A.en
dc.contributor.authorZatsepin, A. F.en
dc.contributor.authorBoukhvalov, D. W.en
dc.contributor.authorKurmaev, E. Z.en
dc.contributor.authorGavrilov, N. V.en
dc.contributor.authorSkorikov, N. A.en
dc.contributor.authorvon, Czarnowski, A.en
dc.contributor.authorFitting, H. -J.en
dc.date.accessioned2021-08-31T15:03:17Z-
dc.date.available2021-08-31T15:03:17Z-
dc.date.issued2015-
dc.identifier.citationOctahedral conversion of a-SiO2 host matrix by pulsed ion implantation / D. A. Zatsepin, A. F. Zatsepin, D. W. Boukhvalov, et al. — DOI 10.1002/pssb.201552103 // Physica Status Solidi (B) Basic Research. — 2015. — Vol. 252. — Iss. 10. — P. 2185-2190.en
dc.identifier.issn3701972-
dc.identifier.otherFinal2
dc.identifier.otherAll Open Access, Green3
dc.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84943197803&doi=10.1002%2fpssb.201552103&partnerID=40&md5=dadf75a96206bdf577a8ad3b249d44eb
dc.identifier.otherhttp://arxiv.org/pdf/1505.06901m
dc.identifier.urihttp://elar.urfu.ru/handle/10995/102349-
dc.description.abstractThe results of measurements of X-ray photoelectron spectra (XPS) of a-SiO2 host material after pulsed implantation with [Mn+] and [Co+, Mn+] ions as well as DFT-calculations are presented. The low-energy shift is found in XPS Si 2p and O 1s core-levels of single [Mn+] and dual [Co+, Mn+] pulsed ion-implanted a-SiO2 (E=30 keV, D=2×1017cm-2) with respect to those of untreated a-SiO2. Similar changes are found in XPS Si 2p and O 1s of stishovite compared to those of quartz. This means that the pulsed ion implantation induces the local high pressure effect that leads to the appearance of SiO6-structural units in a-SiO2 host, forming "stishovite-like" local atomic structure. This process can be described within an electronic bonding transition from the fourfold "quartz-like" to sixfold "stishovite-like" high-pressure phase in the SiO2 host matrix. It is found that such octahedral conversion depends on the fluence and starts with doses higher than D=3×1016cm-2. © 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherWiley-VCH Verlagen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourcePhys. Status Solidi B Basic Res.2
dc.sourcePhysica Status Solidi (B) Basic Researchen
dc.subjectDENSITY FUNCTIONAL THEORYen
dc.subjectION IMPLANTATIONen
dc.subjectMANGANESE IONSen
dc.subjectPHASE TRANSITIONen
dc.subjectQUARTZen
dc.subjectX-RAY PHOTOELECTRON SPECTROSCOPYen
dc.subjectCHEMICAL BONDSen
dc.subjectCRYSTAL ATOMIC STRUCTUREen
dc.subjectDENSITY FUNCTIONAL THEORYen
dc.subjectHIGH PRESSURE EFFECTSen
dc.subjectION IMPLANTATIONen
dc.subjectIONSen
dc.subjectPHASE TRANSITIONSen
dc.subjectPHOTOELECTRON SPECTROSCOPYen
dc.subjectPHOTOELECTRONSen
dc.subjectPHOTONSen
dc.subjectQUARTZen
dc.subjectX RAY PHOTOELECTRON SPECTROSCOPYen
dc.subjectDFT CALCULATIONen
dc.subjectELECTRONIC BONDINGen
dc.subjectHIGH-PRESSURE PHASEen
dc.subjectLOCAL ATOMIC STRUCTURESen
dc.subjectMANGANESE IONSen
dc.subjectMEASUREMENTS OFen
dc.subjectSTRUCTURAL UNITen
dc.subjectX RAY PHOTOELECTRON SPECTRAen
dc.subjectSILICONen
dc.titleOctahedral conversion of a-SiO2 host matrix by pulsed ion implantationen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.1002/pssb.201552103-
dc.identifier.scopus84943197803-
local.contributor.employeeZatsepin, D.A., M. N. Mikheev Institute of Metal Physics of Ural Branch of Russian, Academy of Sciences, Yekaterinburg, 620990, Russian Federation, Institute of Physics and Technology, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation, Institute of Physics, Polish Academy of Sciences, Warszawa, 02-668, Poland
local.contributor.employeeZatsepin, A.F., Institute of Physics and Technology, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employeeBoukhvalov, D.W., Department of Chemistry, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul, 133-791, South Korea, Department of Theoretical Physics and Applied Mathematics, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employeeKurmaev, E.Z., M. N. Mikheev Institute of Metal Physics of Ural Branch of Russian, Academy of Sciences, Yekaterinburg, 620990, Russian Federation, Institute of Physics and Technology, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employeeGavrilov, N.V., Institute of Electrophysics, Russian Academy of Sciences, Ural Branch, Yekaterinburg, 62990, Russian Federation
local.contributor.employeeSkorikov, N.A., M. N. Mikheev Institute of Metal Physics of Ural Branch of Russian, Academy of Sciences, Yekaterinburg, 620990, Russian Federation
local.contributor.employeevon Czarnowski, A., Institute of Physics, University of Rostock, Rostock, 18051, Germany
local.contributor.employeeFitting, H.-J., Institute of Physics, University of Rostock, Rostock, 18051, Germany
local.description.firstpage2185-
local.description.lastpage2190-
local.issue10-
local.volume252-
local.contributor.departmentM. N. Mikheev Institute of Metal Physics of Ural Branch of Russian, Academy of Sciences, Yekaterinburg, 620990, Russian Federation
local.contributor.departmentInstitute of Physics and Technology, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation
local.contributor.departmentInstitute of Physics, Polish Academy of Sciences, Warszawa, 02-668, Poland
local.contributor.departmentDepartment of Chemistry, Hanyang University, 17 Haengdang-dong, Seongdong-gu, Seoul, 133-791, South Korea
local.contributor.departmentDepartment of Theoretical Physics and Applied Mathematics, Ural Federal University, Mira Street 19, Yekaterinburg, 620002, Russian Federation
local.contributor.departmentInstitute of Electrophysics, Russian Academy of Sciences, Ural Branch, Yekaterinburg, 62990, Russian Federation
local.contributor.departmentInstitute of Physics, University of Rostock, Rostock, 18051, Germany
local.identifier.pure295496-
local.identifier.purebfe37205-2ffb-412d-a9b1-d99ad4a1ebf1uuid
local.identifier.eid2-s2.0-84943197803-
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